Software Trace and Log Analysis: A Pattern Reference, 2nd Edition

General trace and log analysis patterns allow application of uniform problem detection and solving approach across diverse software environments. This pattern language covers any execution artifact from a small debugging trace to a distributed log with billions of messages from hundreds of computers, thousands of software components, threads, and processes. Pattern-oriented trace and log analysis is applicable to troubleshooting and debugging Windows, Mac OS X, Linux, FreeBSD, Android, iOS, z/OS, and any other possible computer platform. Its pattern catalog is a part of pattern-oriented software diagnostics, forensics, and prognostics developed by Software Diagnostics Institute (DumpAnalysis.org + TraceAnalysis.org). This reference reprints with corrections 100 patterns originally published in Memory Dump Analysis Anthology volumes 3 – 8a and Software Diagnostics Library (former Crash Dump Analysis blog, DumpAnalysis.org/blog). Full-color diagrams accompany most pattern descriptions.