Structural, Syntactic, and Statistical Pattern Recognition
- Length: 773 pages
- Edition: 1st Edition.
- Language: English
- Publisher: Springer
- Publication Date: 2010-09-30
- ISBN-10: 3642149790
- ISBN-13: 9783642149795
- Sales Rank: #10797561 (See Top 100 Books)
Description
This volume constitutes the refereed proceedings of the Joint IAPR International Workshop, SSPR & SPR 2010, held in Cesme, Izmir, Turkey, in August 2010.
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